Peer Reviewer for multiple international journals, including：
IEEE: ACCESS;
OSA: Optics Letters, Optics Express, Applied Optics;
Elsevier: Patten Recognition,Optical Communications, Optics and Lasers in Engineering;
IET: Electronics Letters, IET Image Processing;
SPIE: Optical Engineering, Journal Electronic Imaging, Journal of Applied Remote Sensing
Member:
IEEE Senior member, Society for Information Display(SID) member.